An examination of the REIT return–implied volatility relation: a frequency domain approach

Emmanuel Anoruo, Vasudeva N. R. Murthy

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Fingerprint

Dive into the research topics of 'An examination of the REIT return–implied volatility relation: a frequency domain approach'. Together they form a unique fingerprint.

Business & Economics